Microscopes and Sample Preparation at DTU Nanolab

DTU Nanolab has a suite of seven complementary electron microscopes. Four scanning electron microscopes (SEM), two of which are dual beam (SEM combined with a focussed ion beam, FIB), and three transmission electron microscopes (TEM).

Three state-of-the-art distinct preparation labs allows the treatment of hard and soft matter samples prior microscope analysis. In addition, there are a number of computers available for off-line image and spectral data analysis, image simulation, and image reconstruction.

Acronyms used in microscope's descriptions

BSE – Back Scattered Electron(s) 

SE – Secondary Electron(s)

BF – Bright Field 
DF – Dark Field 
HAADF – High Angle Annular Dark Field 
HRTEM – High Resolution Transmission Electron Microscopy 
SAED – Selected Area Electron Diffraction 
STEM – Scanning Transmission Electron Microscopy

BF – Bright Field 
BSE – BackScattered electron(s) 
CCD – Charge Coupled Device 
DF – Dark Field 
EBSD – Electron BackScatter Diffraction 
EDS, EDX, EDXS – Energy Dispersive X-ray Spectroscopy 
EELS – Electron Energy-Loss Spectroscopy 
EFTEM – Energy-Filtered Transmission Electron Microscopy 
FEG – Field Emission Gun 
HAADF – High Angle Annular Dark Field 
HRTEM – High-resolution Transmission Electron Microscope 
GIF – Gatan Image Filter 
IGP – Ion Getter Pump 
ODP – Oil Diffusion Pump 
SAED – Selected Area Electron Diffraction 
SDD – Silicon Drift Detector  
SE – Secondary Electron(s) 
SEM – Scanning Electron Microscope 
STEM – Scanning Transmission Electron Microscope 
TEM – Transmission Electron Microscope 
TMP – Turbo Molecular Pump