Characterization
Apply for access to characterization equipment outside the cleanroom
DTU Nanolab hosts a state-of-the-art electron microscopy facility for advanced EM characterization. We provide access to several Scanning Electron Microscopes (SEMs), Dual-beam microscopes (FIB-SEMs) and Transmission Electron Microscopes (TEMs). If you want to learn more about our capabilities, have a look here.
To apply for access, follow the application form further down the page (“Electron Microscopy Equipment”).
Furthermore, DTU Nanolab offers access to additional characterization equipment like e.g. AFM, XRD and XPS. To apply for access, follow the application form “Other Characterization Equipment”.
