Materials science SEM

The scanning electron microscopes are fitted with a field emission gun electron source to provide high imaging resolution and therefore used when information is required at the nano-meter scale. The microscopes can operate in several modes depending on the nature of the sample. All our SEMs are equipped with analytical capabilities (EDX). Furthermore, two of our instruments are equipped with detectors for Electron Backscatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD) allowing for crystallographic orientation mapping.

SEMs at DTU Nanolab:

  • AFEG 250 Analytical ESEM
  • Helios NanoLAB 600
  • Nova NanoSEM 600
  • QFEG 200 Cryo ESEM
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