Characterization
Electron Microscopy and Sample Preparation at DTU Nanolab
DTU Nanolab has a suite of eight complementary electron microscopes for nanoscale characterization in Life Science and Materials Science. Four scanning electron microscopes (SEM), including two dual beam instruments (SEM combined with a focused ion beam, FIB), and three transmission electron microscopes (TEM).
Our distinct preparation labs allow the treatment of hard and soft matter samples prior microscope analysis. In addition, there are a number of computers available for off-line image and spectral data analysis, image simulation, and image reconstruction.
Our distinct preparation labs allow the treatment of hard and soft matter samples prior microscope analysis. In addition, there are a number of computers available for off-line image and spectral data analysis, image simulation, and image reconstruction.